Galaxy Semiconductor’s Examinator Pro is a comprehensive solution for interactive root-cause analysis semiconductor test data. The ‘Wafer Map stacking’ report makes results analysis from multiple wafers an more effective and visual activity.

Further product details

Examinator-Pro™

Ideal for device characterization, reliability assessment and yield analysis. Examinator-Pro is a scalable solution for product and test engineers from first silicon through production.

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Yield-Man™

Offers unattended monitoring, scheduled reporting,and real-time alerts. Ensure that production stays within the expected yield parameters and equipping engineers with the tools for detailed analysis when anomalies arise.

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PAT-Man™

Excels in detecting and excluding outlier devices that could compromise long-term reliability. It balances defects per million and yield, integrating with existing test environments to deliver industry-leading DPM reduction.

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