Analog mixed-signal verification methodology [whitepaper]
Complementary metal-oxide-semiconductor (CMOS) image sensors are a major driver in lucrative digital imagery markets. Used in today’s digital cameras and mobile phones, CMOS image sensors (CIS) have strict high-resolution and high-frame rate requirements. As a result, design verification of CIS is a major challenge. This white paper details how a leading global manufacturer of electronic instruments and electromechanical devices adopted Siemens EDA’s Analog FastSPICE™ (AFS) platform with AFS eXTreme technology and Symphony mixed signal platform to realize over a 3X speed improvement compared to competitive solutions while maintaining required accuracy.
